Our laboratory operates ultrahigh-vacuum scanning probe microscopy, molecular beam epitaxy, Janus 2D-material fabrication, temperature-programmed desorption, radio-frequency STM instrumentation, atomic force microscopy, chemical vapor deposition, and SiC bilayer graphene synthesis systems.
Omicron LTSTM/VTSPM with In-Situ TMD-MBE
MBE1: Se, Te, and two metal sources
A combined low-temperature scanning tunneling microscopy / variable-temperature scanning probe microscopy system integrated with in-situ molecular beam epitaxy for transition-metal dichalcogenide growth and surface studies.
Omicron LTSTM/VTSPM with in-situ MBE and other UHV apparatus.
UHV Janus TMD Fabrication System
Janus 2D-material preparation with Raman characterization
A dedicated ultrahigh-vacuum system for fabricating Janus transition-metal dichalcogenide structures, with Raman characterization capability for monitoring and evaluating material quality.
A UHV system for preparing Janus TMD monolayer, with ECR H plasma source and TMD K cell and UHV Raman.
Hiden Temperature-Programmed Desorption System
TPD measurement and surface reaction analysis
A temperature-programmed desorption system used to study desorption, surface reactions, adsorption states, and thermal stability of prepared surfaces and thin-film materials.
For temperature programmed desorption/mass spectroscopy studies.
Omicron RTSTM with In-Situ TMD-MBE
MBE2: S, Se, and two metal sources
A room-temperature scanning tunneling microscopy system integrated with in-situ molecular beam epitaxy for TMD growth, surface characterization, and rapid feedback during sample development.
A UHV system with RTSTM/RFSTM and MBE2 system.
Patented Radio-Frequency Reflectometry STM
High-frequency STM-related instrumentation
A patented radio-frequency reflectometry STM platform developed for advanced scanning probe measurements and high-frequency electronic characterization at the nanoscale.
A patented special microscope.
Park AFM Systems
Atomic force microscopy and surface morphology
Park atomic force microscopy systems for topographic imaging, surface morphology measurements, and complementary characterization of 2D materials, thin films, and nanostructured surfaces.
Park AFM for morphology measurements.
Chemical Vapor Deposition System (CVD) - CVD1 and CVD2
Chemical vapor synthesis of 2D materials
Chemical vapor deposition systems used for the synthesis of graphene, transition-metal dichalcogenide monolayers, and related two-dimensional materials.
For chemical vapor synthesis of graphene, TMD monolayers, etc.
SiC Bilayer Graphene Synthesis System
Face-to-face synthesis of bilayer graphene on SiC
A dedicated system for synthesizing bilayer graphene on silicon carbide using a face-to-face growth configuration.
For face-to-face synthesis of BLG on SiC.
Additional and Idle Instrumentation
Spare UHV chambers, HREELS, and four-probe station
The laboratory also maintains spare ultrahigh-vacuum chambers and additional instrumentation, including a high-resolution electron energy-loss spectroscopy system and a four-probe station that are currently in idle state.
Spare chamber for UHV component storage; HREELS/probe station are in idle state.
Software - Microscopy Data Processing
Home-made microscopy data processing software
A laboratory-developed software platform for comprehensive data processing for a number of STM, AFM, TEM, customed Raman, ARPES formats, and graphic formats, visualization, spectroscopy, and quantitative analysis. It supports data from multiple commercial microscopy systems and provides an integrated workflow from raw-data inspection to publication-ready visualization and export.
Multi-Format Data Support
Open and process data from major STM and AFM platforms, including RHK SM4, Nanonis, Omicron SCALA/Matrix, Createc, Park Systems, and Gwyddion formats, together with standard graphic images.
Image Processing & 3D Visualization
Correct planes and slopes, remove scan-line artifacts, equalize terrace levels, enhance local contrast, and customize color and LUT transfer functions, or render interactive GPU-accelerated 3D surfaces for microscopy images.
Quantitative & Spectral Analysis
Analyze profiles, drift, histograms, autocorrelation, HHCF and PSDF, together with I-V, dI/dV, Z-V and other spectroscopy data for quantitative characterization.
CITS & FFT Analysis
Explore CITS grid spectroscopy through interactive maps and curves, and extract Bragg peaks and reciprocal-lattice vectors from FFT data for unit-cell analysis.
Data Management & Publication Export
Browse channel-aware thumbnails, rank and annotate files, preserve per-channel layouts, and export publication-ready multi-page 300-DPI PDFs and quantitative data.